We explained the difference between charge mobility of time-of-flight measurement and field-effect measurement in a recent paper. Time-of-flight measurements of the photocurrent in thin organic semiconductor layers represent an effective way to extract charge carrier mobility. A common method to interpret the time-dependence of the photocurrent in these material systems assumes a position-independent electric field between two coplanar electrodes. In this letter, we compare time-dependence of the photocurrent, measured in the samples comprising thin layers of poly-3-hexylthiophene, with the Monte Carlo simulations. In the simulations, we have used both, a position-independent and a position-dependent electric field. We obtained a favorable agreement between the simulations and the measurements only in the case of position-dependent electric field. We demonstrate that the charge carrier mobility may be underestimated by more than one order of magnitude, if a position-independent electric field is used in the calculations of the mobility.